Highlights
- •Cardiac device infection is a major complication that increases morbidity and mortality after the procedure.
- •Several patient-related and device related factors have been identified as predictors of device infection.
- •a Shariff score > 4 has been identified as a predictor of higher risk of infection in patients after de novo device implantation and may help to implement strategies to prevent infections.
Abstract
Background
Cardiac implantable electronic device (CIED) infection is a major complication that
increases morbidity and mortality after the procedure. Several infection risk scores
have been suggested to identify patients at higher pre-procedural risk of infection
Objective
this study sought to evaluate rates of infection, potential risk factors and the role
of a modified “Shariff” score as predictor of infection in high-risk patients undergoing
de novo CIED implantation.
Methods and Results
We retrospectively analysed 1391 patients underwent a de novo CIED procedure during the study period. At the median follow-up of 48 months, 20
patients of 1391 (1.4%) developed a CIED-related infective event. In our population,
we studied a modified version of the “Shariff” score for only first-time implant patients.
At multivariate regression analysis, three factors were independent predictors of
infection: previous pocket hematoma [RR 27.2 (8.30–54.02), p = 10−10], a Shariff Score ≥ 4 [RR 3.20 (1.29–12.59), p= 0.029]. and reintervention for catheter malfunction or dislocation [RR 3.57 (1.2–37.4),
p= 0.048].
Conclusions
a “Shariff” score > 4 is suggested as a predictor of higher risk of infection in patients
after de novo device implantation. The use of an infection risk score may help to
improve tailored pre-operatory strategies to prevent infection.
Keywords
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Article info
Publication history
Published online: February 29, 2020
Accepted:
February 25,
2020
Received in revised form:
February 3,
2020
Received:
December 7,
2019
Identification
Copyright
© 2020 European Federation of Internal Medicine. Published by Elsevier B.V. All rights reserved.
